Analysis of the effect of system parasitic parameters on the switching of SIC devices

Konferenz: PCIM Asia 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
28.08.2024-30.08.2024 in Shenzhen, China

doi:10.30420/566414050

Tagungsband: PCIM Asia 2024

Seiten: 7Sprache: EnglischTyp: PDF

Autoren:
Wu, Qibin; Jaeeul, Yeon; Chen, Lifeng

Inhalt:
This paper mainly analyzes the impact of system parasitic parameters on the usage of SiC devices, and investigates the mechanism of over-current during SiC MOS switch turn-on. The reasons for turn-on current oscillation are also analyzed in this paper. In addition to the impact of parasitic inductance on the voltage stress of power devices, this paper also emphasizes the negative impact of parasitic capacitance on turn-on current stress, current oscillation, and turn-on losses in system design.