Switching Behavior of a 5 kA Press-Pack IGBT for HVDC Applications
Konferenz: PCIM Asia 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
28.08.2024-30.08.2024 in Shenzhen, China
doi:10.30420/566414025
Tagungsband: PCIM Asia 2024
Seiten: 5Sprache: EnglischTyp: PDF
Autoren:
John, Niklas; Fink, Karsten
Inhalt:
Driven by renewable energy sources, the need to transmit a significant amount of energy over long distances leads to rising demand of high-voltage direct-current (HVDC) power grids. Based on this development the requirement for higher power density in insulated-gate bipolar transistors (IGBT) requires an increase in the current-carrying capability of a single package. Press-pack IGBTs (PPIs) are ideal for power-grid and premium medium-voltage-drive topologies in systems of up to +/- 800 kV. Controlling and protecting these systems requires a highly reliable and robust gate-drive unit (GDU) with the ability to safely operate in the full reverse-bias safe operating area (RBSOA) including the ability to securely react to short circuit events and overvoltage situations. This work de-scribes the efforts to achieve an optimized switching behavior using the SCALE(TM)-2 1SP0351V GDU from Power Integrations in conjunction with the Infineon Bipolar 4.5 kV 5 kA P5000ZL45X202 PPI.