Approaches of Tsep Measurements for Power Semiconductors
Konferenz: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
11.06.2024-13.06.2024 in Nürnberg, Germany
doi:10.30420/566262276
Tagungsband: PCIM Europe 2024
Seiten: 9Sprache: EnglischTyp: PDF
Autoren:
Hauenschild, Philipp; Mallwitz, Regine
Inhalt:
This paper discusses different approaches to measuring temperature-sensitive electrical parameters (TSEPs). The construction of a modular research platform for testing different TSEP measurement circuits is described and, using the example of the TSEP forward voltage, offline as well as online measurement results are presented.