Reliability-Optimized Space Vector Modulation (RO-SVM) for Semiconductors Lifetime Enhancement
Konferenz: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
11.06.2024-13.06.2024 in Nürnberg, Germany
doi:10.30420/566262230
Tagungsband: PCIM Europe 2024
Seiten: 7Sprache: EnglischTyp: PDF
Autoren:
Rezaeizadeh, Amin; Mastellone, Silvia
Inhalt:
This paper presents a reliability-optimized space vector modulation (SVM) method for controlling a three phase power converter while reducing the damage on semiconductor switches. Simulation results on IGBTs and SiC MOSFETs switches demonstrate that the thermal stress is significantly alleviated, leading to improved power device lifetime and overall system reliability.