Repetitive Short-circuits on 650 V GaN
Konferenz: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
11.06.2024-13.06.2024 in Nürnberg, Germany
doi:10.30420/566262214
Tagungsband: PCIM Europe 2024
Seiten: 10Sprache: EnglischTyp: PDF
Autoren:
Lambert, Adrien; Morel, Herve; Planson, Dominique; Phung, Luong Viet; Tournier, Dominique; Bevilacqua, Pascal; Guillot, Laurent
Inhalt:
The study consists in analyzing the robustness of 650 V GaN HEMT components in case of shortcircuits. The objective is to develop a test bench for repetitive short-circuits to a component. Electrical characterizations will be carried out before and after the short-circuit cycles to identify the possible parameters drift of the tested devices, to identify the failure mechanisms. Parametric variations have been observed.