ESD Solutions for Discrete 650V Normally-off AlGaN/GaN HEMTs

Konferenz: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
11.06.2024-13.06.2024 in Nürnberg, Germany

doi:10.30420/566262211

Tagungsband: PCIM Europe 2024

Seiten: 6Sprache: EnglischTyp: PDF

Autoren:
Bau, Plinio; Phung, Thanh Hai; Bancal, Bernard; Bergogne, Dominique

Inhalt:
The 650V AlGaN/GaN Schottky gate technology presents a gate structure that can be damaged by ESD discharges. Therefore, discrete power GaN devices can have ESD protection circuits to be used in diverse applications. The use of diodes in series for clamping negative voltages in the gate of HEMT power transistors is discussed. The disadvantage of those solutions is the large area required by ESD diodes and the low breakdown value achieved. To increase the performance of ESD circuits while keeping the circuit consuming low area for a cost-effective solution, two circuits are presented in this paper.