Investigation of Common Source Feedback in SiC Power Modules Regarding Performance and Short Circuit Robustness

Konferenz: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
11.06.2024-13.06.2024 in Nürnberg, Germany

doi:10.30420/566262174

Tagungsband: PCIM Europe 2024

Seiten: 6Sprache: EnglischTyp: PDF

Autoren:
Ruoff, Dominik Alexander; Sim, Zong Xern; Ulrich, Burkhard

Inhalt:
SiC power modules are crucial in the automotive industry due to their high efficiency, but the change from Si to SiC brings new challenges regarding the short-circuit withstand time (SCWT). This paper investigates the influence of a common source feedback gate topology on short-circuit behavior. Implementing source feedback enhances the short-circuit withstand time but comes at the cost of increased switching losses. A more balanced trade-off between robustness and performance can be achieved by combining a welldefined common source feedback with an increasing gate-source voltage. This article investigates the concept using simulations, followed by characterization tests on a prototype commutation cell.