Large-area Bonding with LMEE: Suppression of the Degradation of the Junction-to-Water Thermal Resistance in Power Modules

Konferenz: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
11.06.2024-13.06.2024 in Nürnberg, Germany

doi:10.30420/566262107

Tagungsband: PCIM Europe 2024

Seiten: 5Sprache: EnglischTyp: PDF

Autoren:
Mochizuki, Yo; Otsuka, Takukazu; Kazem, Navid; Shah, Dylan; Nakahara, Ken

Inhalt:
This paper investigates the junction-to-water thermal resistance (Rth) durability of power modules (PMs) during the thermal shock test (TST), in which the PMs were subjected to the thermal cycle from −40 °C to 125 °C with dwell time 20 min for up to 1000 cycles. The PMs contained silicon carbidepower devices, and were bonded to a water cooler by using liquid metal embedded elastomers(LMEE). The bonding was performed at 150 °C for 30 minutes under a pressure of 0.1 MPa. The Rthshowed no significant degradation during the TST. This indicates that LMEE is a good candidate as abonding material for PM-and-cooler assembly for enhancing its durability.