Study of Power Cycling Tests Superimposed with Passive Thermal Cycles on IGBT Modules
Konferenz: PCIM Europe 2023 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
09.05.2023-11.05.2023 in Nürnberg, Germany
doi:10.30420/566091024
Tagungsband: PCIM Europe 2023
Seiten: 10Sprache: EnglischTyp: PDF
Autoren:
Otto, Alexander; Eichhorn, Rico; Rzepka, Sven (Fraunhofer ENAS, Chemnitz, Germany)
Liu, Xing; Basler, Thomas; Lutz, Josef (Chemnitz University of Technology, Chemnitz, Germany)
Inhalt:
This paper details the results of comprehensive experimental reliability tests performed on industrial IGBT modules. Main goal of this study was to investigate the main failure modes for power cycling tests that were superimposed with passive thermal cycles and to compare them with the failure characteristic of standard power cycling and passive thermal shock tests. In addition, a lifetime model was derived on the basis of the standard power cycling tests and compared with the results of the superimposed power cycling tests.