Reliability Evaluation of New Generation High Temperature Capacitor Films for Inverter Applications

Inhalt:
Reliability of a new generation of capacitor films has been evaluated by means of life-testing for 2000 hours at 150deg C under voltage. The new films were developed for high heat capacitors suited for AC-DC inverter modules using SiC or GaN MOSFETS. The films could potentially reduce or eliminate active cooling. The films exhibit stable Dk (2.9), low Df (0.0017), and breakdown voltage of about 500 V/µm over the temperature range. Capacitors made with these films pass stringent industry reliability testing having <5% capacitance change, stable insulation resistance, and low dissipation losses over 2000 hours. The ultra-thin 3 & 5 µm films, made from a highheat engineering thermoplastic material, are compatible with existing downstream metallization, slitting and capacitor building technologies.