The Impact of Power Cycling Induced Degradation Mechanisms on the Magnetic Field Signature of IGBTs
Konferenz: PCIM Europe 2022 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
10.05.2022 - 12.05.2022 in Nürnberg, Germany
doi:10.30420/565822122
Tagungsband: PCIM Europe 2022
Seiten: 6Sprache: EnglischTyp: PDF
Autoren:
Wolff, Michael; Griepentrog, Gerd (Technische Universität Darmstadt, Germany)
Inhalt:
This paper presents the effect of power semiconductor joining degradation on the surrounding magnetic field caused by the chips load current. Therefore, a number of IGBT samples were artificially aged by power cycling. After the aging process, the magnetic field pattern was measured and evaluated. On this basis the viability of the magnetic field signature as a means to detect power semiconductor degradation is discussed.