Enhancing silicon carbide CoolSiC(TM) MOSFET 1200 V performance with improved D2Pak package using diffusion-soldering die attach
Konferenz: PCIM Europe digital days 2020 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
07.07.2020 - 08.07.2020 in Deutschland
Tagungsband: PCIM Europe digital days 2020
Seiten: 5Sprache: EnglischTyp: PDF
Autoren:
Cerezo, Jorge; Klobucar, Blaz; Engl, Lisa (Infineon Technologies AG, Austria)
Inhalt:
This paper presents a new enhanced silicon carbide CoolSiC(TM) MOSFET 1200 V that makes use of the benefits of an improved D2Pak (TO-263) 7-pin package using a diffusion-soldering die-attach process. The significant thermal performance improvement of the package, in combination with state-of-the-art silicon carbide trench MOSFET 1200 V technology, has resulted in an excellent surface-mounted CoolSiC(TM) MOSFET 1200 V device with lower power losses and stray inductance, thus lower operating junction temperatures in the application, and improved reliability. It also enables reduced system costs because of faster assembly, one of the well-known advantages of surface-mounted device (SMD) packages. In brief, the new device helps to fulfill the increasing demand for higher power density, lower cost, and higher reliability of modern industrial and consumer systems.