Improved Double-Pulse Tests for Medium-Voltage Devices

Inhalt:
It has been found that the turn-off behavior of medium voltage IGBTs changes significantly with the duration that the device was turned on before the turn-off event. When the duration of actual pulses are close to the minimum conduction-time (typically 10mus), this effect is most pronounced. However, this effect is still visible for significantly longer pulses (>100mus). In this paper, it will be explained how this effect has been found during “normal” double-pulse tests. Then it will be shown how this effect can be systematically analyzed and quantified using an adapted double pulse test.