A Pseudo-Random Data Generator for Program-Based DDR DRAM BIST with Custom Defined Testing Algorithms

Inhalt:
The aim of this work is to develop a pseudo-random data generator for program-based DRAM Built-In Self Test (BIST) technology which is finally applied to the verification of DIMM modules. The requirements to meet dedicated DDR DRAM BIST applications are analysed and the implementation of a suitable random data generator is discussed. The proposed methodology has been finally verified by the hardware implementation and lab testing.