Impact of VCE,sat measurement conditions on cycle-to-failure determination of IGBT samples in power cycling test

Konferenz: CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems
12.03.2024-14.03.2024 in Düsseldorf, Germany

Tagungsband: ETG-Fb. 173: CIPS 2024

Seiten: 5Sprache: EnglischTyp: PDF

Autoren:
Zhang, Yichi; Zhang, Yi; Yao, Bo; Wang, Huai (AAU Energy, Aalborg University, Aalborg, Denmark)

Inhalt:
This paper investigates the impact of different measurement conditions of on-state saturation voltage, in terms of current and temperature, on the cycle-to-failure determination of IGBT samples in the power cycling test. It is based on comparing the obtained cycle-to-failure according to the end-of-life (EOL) criterion and the cycle-to-failure when the respective samples become open circuits. The results from two of the representative measurement conditions are experimentally compared based on the widely used percentage-based EOL criterion and a recently proposed gradient-based EOL criterion.