A Fast Source to Drain Voltage Measurement in Bridge Topologies Using a Freewheeling Path for Dynamic Power Cycling Tests
Konferenz: CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems
12.03.2024-14.03.2024 in Düsseldorf, Germany
Tagungsband: ETG-Fb. 173: CIPS 2024
Seiten: 7Sprache: EnglischTyp: PDF
Autoren:
Baron, Kevin Munoz; Swaroop Dash, Sarthak; Solomakha, Oleksandr; Kallfass, Ingmar (Institute of Robust Power Semiconductor Systems, University of Stuttgart, Germany)
Inhalt:
Temperature monitoring in power cycling tests is crucial for the comprehensive evaluation of the reliability of semiconductor devices as it has a major influence on the results. This can be achieved by using the forward voltage drop of the body diode of a MOSFET known as the