Machine learning for improving the trustworthiness of sensors

Konferenz: AmEC 2024 – Automotive meets Electronics & Control - 14. GMM Symposium
14.03.2024-15.03.2024 in Dortmund, Germany

Tagungsband: GMM-Fb. 108: AmEC 2024

Seiten: 6Sprache: EnglischTyp: PDF

Autoren:
Hussain, Ghazanfer; Thekkumthala, Levin G.; William, Peter A. (Faculty IV, ECE, University of Siegen, Germany)
Wahl, Michael G. (Faculty IV, ECE, University of Siegen, Germany & Digital University Kerala, Siegen, Germany)

Inhalt:
Artificial Intelligence / Machine Learning (AI/ML) is a technique with two well-known applications: image analysis and text analysis. In this paper, we will describe an application of AI/ML to a simple 6D acceleration sensor, illustrating the challenges of technical applications and sketching the path for using AI/ML in this environment, where the target is to identity faulty patterns in the data set.