Extended Abstract: Data-Driven Test Generation for Black-Box Systems From Learned Decision Tree Models

Konferenz: MBMV 2023 – Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen - 26. Workshop
23.03.2023-24.03.2023 in Freiburg

Tagungsband: ITG-Fb. 309: MBMV 2023

Seiten: 2Sprache: EnglischTyp: PDF

Autoren:
Plambeck, Swantje; Fey, Goerschwin (Institute of Embedded Systems, Hamburg University of Technology, Hamburg, Germany)

Inhalt:
Testing black-box systems is a difficult task, because no prior knowledge on the system is given that can be used for design and evaluation of tests. Learning a model of a black-box system from observations enables Model-Based Testing (MBT). We take a recent approach using decision tree learning to create a model of a black-box system and discuss the usage of such a decision tree model for test generation. A decision tree model especially facilitates MBT for black-box systems if no system reset is possible. A case study on a discrete system illustrates our MBT approach.