Reliability of Capacitors and Magnetic Components in Power Electronic Applications
Konferenz: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
24.03.2020 - 26.03.2020 in Berlin, Deutschland
Tagungsband: ETG-Fb. 161: CIPS 2020
Seiten: 6Sprache: EnglischTyp: PDF
Autoren:
Wang, Huai; Wang, Haoran; Shen, Zhan (Aalborg University, Aalborg, Denmark)
Inhalt:
This paper presents the wear out related reliability studies of capacitors and magnetic components used for power electronic converters. Accelerated lifetime testing, failure mechanisms, lifetime prediction and reliability design are presented based on the state-of-the-arts.