End-of-life mechanism due to cyclic thermomechanical loading of power modules with .XT joining technology
Konferenz: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
24.03.2020 - 26.03.2020 in Berlin, Deutschland
Tagungsband: ETG-Fb. 161: CIPS 2020
Seiten: 5Sprache: EnglischTyp: PDF
Autoren:
Methfessel, Torsten; Jaehme, Hendrik (Infineon Technologies AG, Warstein, Germany)
Inhalt:
Further investigation results from power-cycling (PC) tests with Infineon .XT PrimePACK(TM) power modules and low cycle times reveal a significant change in the running time until end of life (EOL) as well as a predominant aging mechanism compared to power modules with standard joining technology. While the standard technology shows a Vce increase caused by a bond-wire detachment as the most prominent EOL mechanism, the .XT reaches EOL via Rth increase, mostly due to a degradation of the underlying substrate-to-base-plate solder layer (substrate solder).