Implementation and validation of a dynamic calorimetric method to evaluate the losses in switching discrete power MOSFETs

Inhalt:
The design of static converters is based on various factors, including the losses in power semiconductor components and the working temperature of these components. This paper presents a dynamic calorimetric method whose objective is to estimate losses in semiconductor components with consideration of their evolution as a function of junction temperature. In order to evaluate the accuracy of this method, experimental tests are carried out with power MOSFET components used in a switching cell. A method for separating conduction and switching losses is also proposed.