Lifetime Analysis of IGBTs in Periodic Surge Current Operation
Konferenz: CIPS 2016 - 9th International Conference on Integrated Power Electronics Systems
08.03.2016 - 10.03.2016 in Nürnberg, Deutschland
Tagungsband: CIPS 2016
Seiten: 3Sprache: EnglischTyp: PDF
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Autoren:
Kemper, J.; Hoffmann, K. (Helmut Schmidt University, Hamburg, Germany)
Nevoigt, J. (Federal Armed Forces, Germany)
Huebner, H. (TAZ GmbH, Germany)
Inhalt:
IGBTs are the key-component in an increasing number of power converters today. Based on the company-specific design rules and the limitations defined by the manufacturers of the power semiconductors, the chips are often selected with respect to the worst case load scenario. As this case appears rarely during the lifetime of the system, the system is often larger and more expensive than it might be. Selecting chips with respect to the normal load case results in a system that is more lightweight, has smaller dimensions and is less expensive. One drawback of this decision is that the designer has to analyse the system behaviour in overload condition carefully and define a lifetime model for the specific application. This paper discusses the consequences of using discrete IGBTs in periodic surge current operation and analysis the consequences for the lifetime of the chips.