Test System for the Reliability Management of Power Modules
Konferenz: CIPS 2008 - 5th International Conference on Integrated Power Electronics Systems
11.03.2008 - 13.03.2008 in Nuremberg, Germany
Tagungsband: CIPS 2008
Seiten: 5Sprache: EnglischTyp: PDF
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Autoren:
Wernicke, Thies; Middendorf, Andreas; Dieckerhoff, Sibylle; Reichl, Herbert (Berlin Institute of Technology)
Guttowski, Stephan (Fraunhofer Institute for Reliability and Microintegration)
Inhalt:
This work describes methods to determine ageing of IGBT power semiconductor modules. The relevant parameters for fatigue during operation are identified. Based on a standard model for end-of-life prediction of IGBT modules, a method for on-line estimation of deterioration under normal operation conditions is proposed. A test system to evaluate the proposed methods predicting power module degradation is presented.