IEC TS 62607-6-11:2022
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
Ausgabedatum:
2022-02
Edition:
1.0
Sprache: EN - englisch
Seitenzahl: 27 VDE-Artnr.: 250682
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy