IEC 62047-40:2021
Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
Ausgabedatum:
2021-09
Edition:
1.0
Sprache: EN - englisch
Seitenzahl: 11 VDE-Artnr.: 250252
IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.