IEC 62899-503-1:2020
Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
Ausgabedatum:
2020-05
Edition:
1.0
Sprache: EN - englisch
Seitenzahl: 15 VDE-Artnr.: 248780
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).