IEC TR 62878-2-2:2015
Device embedded substrate - Part 2-2: Guidelines - Electrical testing
Ausgabedatum:
2015-12
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 29 VDE-Artnr.: 222386
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.