IEC 60191-6-21:2010
Mechanical standardization of semiconductor devices - Part 6-21: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline packages (SOP)
Ausgabedatum:
2010-08
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 28 VDE-Artnr.: 217499
IEC 60191-6-21:2010 specifies methods to measure package dimensions of small outline packages (SOP), package outline form E in accordance to IEC 60191-4.