IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Ausgabedatum:
2003-02
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 7 VDE-Artnr.: 210499
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.