IEC 60748-11-1:1992
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
Ausgabedatum:
1992-04
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 71 VDE-Artnr.: 204979
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.