IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Ausgabedatum:
1980-01
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 18 VDE-Artnr.: 202820
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.