IEC 60512-25-3:2001
Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation
Ausgabedatum:
2001-07
Edition:
1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 23 VDE-Artnr.: 200284
Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.