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E DIN EN IEC 60749-24 VDE 0884-749-24:2025-04

Semiconductor devices – Mechanical and climatic test methods

Part 24: Accelerated moisture resistance – Unbiased HAST

(IEC 47/2863/CDV:2024); German and English version prEN IEC 60749-24:2024
Class/Status: Draft, valid
Released: 2025 -04 Published: 2025-03 -28
VDE Art. No.: 1800930
End of objection deadline: 2025-05-28

The unbiased highly accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. Bias is not applied in this test to ensure that the failure mechanisms potentially overshadowed by bias can be uncovered (e.g. galvanic corrosion). This test is used to identify failure mechanisms internal to the package and is destructive.

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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E DIN EN IEC 60749-24 VDE 0884-749-24:2025-04

Semiconductor devices – Mechanical and climatic test methods

Part 24: Accelerated moisture resistance – Unbiased HAST

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