DIN EN 61000-4-20 VDE 0847-4-20 Berichtigung 1:2012-09

Corrigendum 1 serves for the correction of translation errors in the German version of the European Standard EN 61000-4-20:2010 which takes over the International Standard IEC 61000-4-20:2010. The standard relates to emission and immunity test methods for electrical and electronic equipment in relation to high frequency electromagnetic fields using various types of transverse electromagnetic (TEM) waveguides. They include open (for example, striplines and EMP” simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. Equipment under test that shall be tested in TEM waveguides must be small and no lines shall be connected to them. In relation to the previous standard the text was re-structured and the clauses 7 to 9 and a new informative annex E concerning the validation of field probes was added.