DIN EN 62132-2 VDE 0847-22-2:2011-07

Integrated circuits – Measurement of electromagnetic immunity

Part 2: Measurement of radiated immunity – TEM cell and wideband TEM cell method

(IEC 62132-2:2010); German version EN 62132-2:2011
Class/Status: Standard, valid
Released: 2011-07
VDE Art. No.: 0847092

Contents (only German)

This document specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the charcteristics of the TEM cell.

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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DIN EN 62132-2 VDE 0847-22-2:2011-07

Integrated circuits – Measurement of electromagnetic immunity

Part 2: Measurement of radiated immunity – TEM cell and wideband TEM cell method

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