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DIN EN IEC 60749-5 VDE 0884-749-5:2024-09

Semiconductor devices – Mechanical and climatic test methods

Part 5: Steady-state temperature humidity bias life test

(IEC 60749-5:2023); German version EN IEC 60749-5:2024
Class/Status: Standard, valid
Released: 2024-09
VDE Art. No.: 0801005

This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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DIN EN IEC 60749-5 VDE 0884-749-5:2024-09

Semiconductor devices – Mechanical and climatic test methods

Part 5: Steady-state temperature humidity bias life test

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