DIN EN IEC 60749-17 VDE 0884-749-17:2019-11

Semiconductor devices – Mechanical and climatic test methods

Part 17: Neutron irradiation

(IEC 60749-17:2019); German version EN IEC 60749-17:2019
Class/Status: Standard, valid
Released: 2019-11
VDE Art. No.: 0800618

Contents (only German)

This part of series DIN EN 60749 (VDE 0884-749) provides the neutron irradiation test, which is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. These tests are applicable to integrated circuits and discrete semiconductor devices.

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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DIN EN IEC 60749-17 VDE 0884-749-17:2019-11

Semiconductor devices – Mechanical and climatic test methods

Part 17: Neutron irradiation

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