DIN EN 60749-28 VDE 0884-749-28:2018-02

Semiconductor devices – Mechanical and climatic test methods

Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – Device level

(IEC 60749-28:2017); German version EN 60749-28:2017
Class/Status: Standard, valid
Released: 2018-02
VDE Art. No.: 0800467

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This part of DIN EN 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

Click on the appropriate Subject Area Link to display all valid Documents or use the Standards Search.


Standard: NEW DIN EN IEC 60749-28 VDE 0884-749-28:2024-12 Semiconductor devices – Mechanical and climatic test methods Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level » More Information 100.60 € 100.60 €

DIN EN 60749-28 VDE 0884-749-28:2018-02

Semiconductor devices – Mechanical and climatic test methods

Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – Device level

NEW DIN EN IEC 60749-28 VDE 0884-749-28:2024-12

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