DIN EN 62779-2 VDE 0884-79-2:2017-01

Semiconductor devices – Semiconductor interface for human body communication

Part 2: Characterization of interfacing performances

(IEC 62779-2:2016); German version EN 62779-2:2016
Class/Status: Standard, valid
Released: 2017-01
VDE Art. No.: 0800378

Contents (only German)

This part of DIN EN 62779 (VDE 0884-79) defines a measurement method on electrical performances of an electrode that composes a semiconductor interface for human body communication (HBC). It includes general and functional specifications of the measurement method.

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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DIN EN 62779-2 VDE 0884-79-2:2017-01

Semiconductor devices – Semiconductor interface for human body communication

Part 2: Characterization of interfacing performances

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