DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08

Integrated circuits – Measurement of electromagnetic immunity

Part 9: Measurement of radiated immunity – Surface scan method

(IEC/TS 62132-9:2014)
Class/Status: Standard, valid
Released: 2015-08
VDE Art. No.: 0800259

This part of IEC 62132 provides a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit (IC). This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization.

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08

Integrated circuits – Measurement of electromagnetic immunity

Part 9: Measurement of radiated immunity – Surface scan method

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