DIN IEC/TS 61967-3 VDE V 0847-21-3:2015-08

Integrated circuits – Measurement of electromagnetic emissions

Part 3: Measurement of radiated emissions – Surface scan method

(IEC/TS 61967-3:2014)
Class/Status: Standard, valid
Released: 2015-08
VDE Art. No.: 0800258

This part of IEC 61967 provides a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit (IC). This method provides a mapping of the electric or magnetic near-field emissions over the IC and is intended for use up to 6 GHz.

This Document is related to the following Topics (in bold):

31	ELECTRONICS
31.020	Electronic components in general
31.040	Resistors
31.060	Capacitors
31.080	Semiconductor devices
31.120	Electronic display devices
31.140	Piezoelectric devices
31.160	Electric filters
31.180	Printed circuits and boards
31.190	Electronic component assemblies
31.200	Integrated circuits. Microelectronics
31.220	Electromechanical components for electronic and telecommunications equipment
31.240	Mechanical structures for electronic equipment
31.260	Optoelectronics. Laser equipment

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DIN IEC/TS 61967-3 VDE V 0847-21-3:2015-08

Integrated circuits – Measurement of electromagnetic emissions

Part 3: Measurement of radiated emissions – Surface scan method

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