Power Cycling Results for Reliability Studies of SiC-Inverters

Abstract:
Amidst the electrification of aviation, this paper discusses the reliability of silicon carbide (SiC) metal–oxide–semiconductor field-effect transistors (MOSFETs). With the help of the widely used power cycling test (PCT), the bond wire connections in particular are aged cyclically in this study. The AQG 324 used in the automotive industry serves as a reference for defining test conditions and threshold values. The paper illustrates step by step how the parameters of the underlying LESIT lifetime model can be found from the PCT data. The lifetime parameters found are classified and checked for plausibility with the help of existing literature.