Statistics-based Lifetime Simulation Methodology for Power Modules incorporating Degradation Models

Abstract:
The standard approach for the lifetime estimation of power modules (PM) is based on lifetime models derived from accelerated lifetime test (ALT) data. In the mission profile-based simulation, the lifetime model is included, but it does not account for the impact of degradation on the PM model. Therefore, in this paper, a new simulation methodology is proposed for mission profile-based lifetime studies incorporating degradation models, and a statistical analysis is applied that leads to ≈20% better lifetime estimation for the chosen use case.