Approaches of Tsep Measurements for Power Semiconductors
Conference: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06/11/2024 - 06/13/2024 at Nürnberg, Germany
doi:10.30420/566262276
Proceedings: PCIM Europe 2024
Pages: 9Language: englishTyp: PDF
Authors:
Hauenschild, Philipp; Mallwitz, Regine
Abstract:
This paper discusses different approaches to measuring temperature-sensitive electrical parameters (TSEPs). The construction of a modular research platform for testing different TSEP measurement circuits is described and, using the example of the TSEP forward voltage, offline as well as online measurement results are presented.