Reliability-Optimized Space Vector Modulation (RO-SVM) for Semiconductors Lifetime Enhancement
Conference: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06/11/2024 - 06/13/2024 at Nürnberg, Germany
doi:10.30420/566262230
Proceedings: PCIM Europe 2024
Pages: 7Language: englishTyp: PDF
Authors:
Rezaeizadeh, Amin; Mastellone, Silvia
Abstract:
This paper presents a reliability-optimized space vector modulation (SVM) method for controlling a three phase power converter while reducing the damage on semiconductor switches. Simulation results on IGBTs and SiC MOSFETs switches demonstrate that the thermal stress is significantly alleviated, leading to improved power device lifetime and overall system reliability.