Repetitive Short-circuits on 650 V GaN
Conference: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06/11/2024 - 06/13/2024 at Nürnberg, Germany
doi:10.30420/566262214
Proceedings: PCIM Europe 2024
Pages: 10Language: englishTyp: PDF
Authors:
Lambert, Adrien; Morel, Herve; Planson, Dominique; Phung, Luong Viet; Tournier, Dominique; Bevilacqua, Pascal; Guillot, Laurent
Abstract:
The study consists in analyzing the robustness of 650 V GaN HEMT components in case of shortcircuits. The objective is to develop a test bench for repetitive short-circuits to a component. Electrical characterizations will be carried out before and after the short-circuit cycles to identify the possible parameters drift of the tested devices, to identify the failure mechanisms. Parametric variations have been observed.