Parameter Identification: Gate Sensor for Power Transistor Tolerance Compensation in Advanced Gate Driver ICs

Conference: PCIM Europe 2024 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
06/11/2024 - 06/13/2024 at Nürnberg, Germany

doi:10.30420/566262015

Proceedings: PCIM Europe 2024

Pages: 7Language: englishTyp: PDF

Authors:
Satheesh, Rakshith; Wille, Christopher; Kulkarni, Pushkar; Menzel, Andreas; Rosahl, Thoralf

Abstract:
This paper introduces an innovative approach to optimize power module performance by implementing a Parameter Identification (PI) mode in advanced high voltage gate drivers, which can enhance both the efficiency and lifespan of power electronic systems. The paper details the development and integration of the PI mode within the gate driver architecture. We present a comprehensive analysis of the test conditions and experimental results, demonstrating several options PI offers to enhance system performance. The findings underscore the potential of integrating parameter identification capabilities in gate drivers to achieve optimal power module operation, offering substantial benefits in terms of energy efficiency and system robustness.