Improved Double-Pulse Tests for Medium-Voltage Devices
Conference: PCIM Europe digital days 2020 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
07/07/2020 - 07/08/2020 at Deutschland
Proceedings: PCIM Europe digital days 2020
Pages: 6Language: englishTyp: PDF
Authors:
Asam, Johann; Kell, Max-Josef; Mari, Jorge; Schroeder, Stefan; Schuetz, Tobias (Danfoss Silicon Power GmbH, Germany)
Abstract:
It has been found that the turn-off behavior of medium voltage IGBTs changes significantly with the duration that the device was turned on before the turn-off event. When the duration of actual pulses are close to the minimum conduction-time (typically 10mus), this effect is most pronounced. However, this effect is still visible for significantly longer pulses (>100mus). In this paper, it will be explained how this effect has been found during “normal” double-pulse tests. Then it will be shown how this effect can be systematically analyzed and quantified using an adapted double pulse test.