Calorimetric Measurement of Wide Bandgap Semiconductors Switching Losses
Conference: PCIM Europe 2017 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
05/16/2017 - 05/18/2017 at Nürnberg, Deutschland
Proceedings: PCIM Europe 2017
Pages: 6Language: englishTyp: PDF
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Authors:
Bolte, Sven; Wohlrab, Lukas; Afridi, Jehan Khan; Froehleke, Norbert; Boecker, Joachim (University of Paderborn, Germany)
Abstract:
The fast switching of wide-bandgap semiconductors makes it challenging to measure their switching losses exactly. In order to receive accurate results with the double-pulse test, a time delay error between the measured voltage and current has to be corrected very precisely. Since the real values are not known, a calorimetric method was developed to verify the results of the double-pulse test. Switching loss measurements with both methods were conducted for a gallium nitride transistor. By comparison, it can be observed that the results of the calorimetric measurement stay within the expected maximum deviation of the double-pulse test which recommends this method as an alternative.