Logic Self Repair Based on Regular Building Blocks
Conference: ARCS 2009 - 22th International Conference on Architecture of Computing Systems
03/11/2009 at Delft, The Netherlands
Proceedings: ARCS 2009
Pages: 6Language: englishTyp: PDF
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Authors:
Koal, Tobias; Vierhaus, Heinrich T. (Brandenburg University of Technology Cottbus, Department of Computer Science)
Abstract:
The scalability of CMOS technology is apparently approaching physical limits. In particular, technology forecasts expect higher rates of permanent and transient faults, which make fault tolerant design and, eventually, built-in self repair (BISR) capabilities a necessity. While BISR works reasonably in regular structures such as memory blocks, BISR for random logic is by far an unsolved problem. This paper introduces a novel systematic approach towards logic BISR and gives some indications for cost and limitations.